Capital Equipment

Capital Equipment

Atomic Force Microscope

Queen Mary University of London

Our Afm Imaging Technique Uses A Very High Resolution Type Spm, More Than 1000 Times Higher Quality Than The Optical Diffraction Limits And It Is Used Predominatley As A Tool For Imaging, Measuring And Manipulating Matter At The Nanoscale. The Atomic Force Microscope (Afm) Or Scanning Force Microscope (Sfm) Uses A Very High-Resolution Type Of Scanning Probe Microscope, With Demonstrated Resolution Of Fractions Of A Nanometer.

No. Available: 1

Dr Emiliano Bilotti

Application(s): Research